Run-length distributions of Q-chart schemes.: An article from: IIE Transactions |  | Author: Paul F. Zantek
Publisher: Thomson Gale
Category: Book
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Pages: 28
Publication Date: November 1, 2005
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This digital document is an article from IIE Transactions, published by Thomson Gale on November 1, 2005. The length of the article is 8125 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.
From the author: This article studies the performance of the Shewhart chart of Q statistics in the detection of process mean shifts in start-up processes and short runs. We propose an accurate, analytic approximation of this chart's run-length distribution. Our study reveals that the chart has an early detection advantage in that it is more likely than other methods to detect a process mean shift within the first few observations following the shift. This is a desirable property because early detection should make it easier to identify the cause of the shift, increasing the rate of continuous quality improvement. In addition, our analysis illustrates the importance of reacting immediately to out-of-control signals from the chart as compared to waiting for subsequent observations to confirm the presence of a shift.
Citation Details
Title: Run-length distributions of Q-chart schemes.
Author: Paul F. Zantek
Publication: IIE Transactions (Magazine/Journal)
Date: November 1, 2005
Publisher: Thomson Gale
Volume: 37 Issue: 11 Page: 1037(9)
Distributed by Thomson Gale
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