Modeling Random Systems | 
enlarge | Author: John R. Cogdell Publisher: Prentice Hall Category: Book
List Price: $142.00 Buy New: $8.99 You Save: $133.01 (94%)
New (13) Used (15) from $4.20
Rating: 1 reviews Sales Rank: 510332
Media: Paperback Pages: 720 Number Of Items: 1 Shipping Weight (lbs): 2.3 Dimensions (in): 9.2 x 6.9 x 1.3
ISBN: 0131414372 Dewey Decimal Number: 003.76 EAN: 9780131414372
Publication Date: March 20, 2004 Availability: Usually ships in 1-2 business days
| |
| Editorial Reviews:
Product Description
This book introduces the reader to the basic concepts of randomness and how to use these to model random systems. Material on probability, statistics, and random processes are presented in the context of developing useful models for systems involving randomness. This book also instructs the reader on how to recognize that a model is possible in a real-life situation, craft an appropriate model, do the math, and interpret the results in practical realities. For anyone seeking to learn the art of modeling systems with random aspects.
|
| Customer Reviews:
Many interesting examples for engineers... September 19, 2006 Steven J. Wojtczuk (Lexington, MA) This book contains many interesting examples for engineers and scientists that I have not seen in other elementary probability textbooks, such as the expected distance between points in a two-dimensional spatial Poisson process ("distance between wildflowers in a field" example) which I find useful to model IC defects and in many other applications. The level of mathematical rigor is perhaps low for mathematics students, but I think is fine for most engineer and science students. The book is quite readable. There are many worked examples, as well as answers to many problems. I think it is a mistake to integrate the text so much with Mathematica, since the text is unique enough to stand alone. There is a one chapter on statistics including hypothesis testing which is a reasonable although brief introduction, but I do not think fits in well with the rest of the book. The book is biased toward EE applications.
|
|
|